Polycrystalline X-ray diffractometer

Used for qualitative and quantitative analysis of crystal structure. The product is designed on the basis of Zx3, and the scanning radius of the goniometer can be continuously adjustable within the range of 150 ~ 285mm. This function enables the user to make a balanced selection between the instrument angular resolution and the test diffraction intensity, and set the required test conditions to meet the test requirements of different situations. In order to improve the experimental efficiency, zx6 has increased the fast rotation speed to 1800 ° /min.

New structure, advanced vertical goniometer structure, more convenient sample placement, greatly simplified operation and maintenance, more intuitive use, and easy to clean the sample table after the experiment.

The subdivision driving power supply technology is adopted, with high precision, repeatability of 0.0005 °, measurement repeatability of 0.001 °, minimum step angle of 0.0001 °, and continuously adjustable scanning radius;

Imported NaI scintillation crystal counting detector, with good resolution and long-term stability;

The X-ray tube sleeve is made of integral copper bar with better positioning accuracy and ray

protection;

The rotary shutter is adopted, with faster switching speed, lower failure rate, better ray blocking performance, and the radiation dose outside the cabinet is less than 0.2 μ Sv/h (national standard requirements are lower than 2.5 μ Sv/h）；

The digital control circuit of X-ray light source has been further improved. The working power of X-ray machine is completely set by computer remote control. The loading process of high pressure and pipe flow is automatically controlled by microcomputer, which makes it simpler to use and more reliable to operate;

Chinese window operation i

nterface, a newly revised PDP diffraction data processing software package. Significant improvements have been made in the diversity of data output.